21. Lock-in thermography
پدیدآورنده : O. Breitenstein, W. Warta, M. Langenkamp.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Electronic apparatus and appliances-- Testing.,Electronic apparatus and appliances-- Thermal properties.,Semiconductors-- Thermal properties.,Thermography.
رده :
TK7870
.
25
.
B74
2010eb
22. Lock-in thermography
پدیدآورنده : / O. Breitenstein, W. Warta, M. Langenkamp
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Electronic apparatus and appliances, Thermal properties,Electronic apparatus and appliances, Testing,Semiconductors, Thermal properties,Thermography
رده :
E-BOOK
23. Microelectronic failure analysis: Instrumentation, science, materials and applications
پدیدآورنده : prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee
کتابخانه: Library of Institute For Color Science and Technology (Tehran)
موضوع : Electronics--Materials--Testing--Handbooks, manuals, etc,Microelectronics--Materials--Testing--Handbooks, manuals, etc,Microelectronics--Materials--Defects--Handbooks, manuals, etc,Electronic apparatus and appliances--Testing--Handbooks, manuals, etc,Semiconductors--Defects--Handbooks, manuals, etc
رده :
{
1648
},
fe823984b80082dc2d17ebe2cd118be2
24. Microelectronic test structures for CMOS technolog
پدیدآورنده : / Manjul Bhushan, Mark B. Ketchen
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Metal oxide semiconductors, Complementary, Testing,Electronic books., local
رده :
TK7871
.
99
.
M44
,
B48
2011
25. Microelectronic test structures for CMOS technology
پدیدآورنده :
کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)
موضوع : Metal oxide semiconductors, Complementary ; Testing. ;
26. Microelectronic test structures for CMOS technology
پدیدآورنده : / Manjul Bhushan, Mark B. Ketchen
کتابخانه: University of Tabriz Library, Documentation and Publication Center (East Azarbaijan)
موضوع : Metal oxide semiconductors, Complementary--Testing
رده :
TK7871
.
99
.
M44B49
2011
27. Nondestructive evaluation of semiconductor materials and devices: )lectured presented at the NATO advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices, held at the Villa Tuscolano, Italy, September 19-29, 1978
پدیدآورنده : edited by Jay N. Zemel
کتابخانه: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
موضوع : Semiconductors - Testing - Congresses
رده :
TK
7871
.
85
.
N376
1978
28. Optical absorption of impurities and defects in semiconducting crystals :
پدیدآورنده : Bernard Pajot, Bernard Clerjaud.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Crystal optics.,Optical spectroscopy.,Semiconductors-- Optical properties.,Semiconductors-- Testing-- Optical methods.
رده :
QC611
.
6
.
O6
P35
2013
29. Optical characterization of semiconductors :
پدیدآورنده : Sidney Perkowitz
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Semiconductors-- Testing-- Optical methods
رده :
TK7871
.
85
.
P426
1993
30. Optical characterization of semiconductors
پدیدآورنده : Sidney Perkowitz,Title
کتابخانه: Central Library of Imam Khomeini International University of Qazvin (Qazvin)
موضوع : Semiconductors- Testing- Optical methods,Semiconductors- Optical properties
رده :
TK
.
P426
7871
.
85
1993
31. Optical characterization of semiconductors : infrared, Raman, and photoluminescence spectroscopy
پدیدآورنده : Perkowitz, S.
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : ، Semiconductors-- Testing-- Optical methods,، Semiconductors-- Optical properties
رده :
TK
7871
.
85
.
P426
1993
32. Photomodulated optical reflectance
پدیدآورنده : / Janusz Bogdanowicz
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Semiconductors--Testing--Optical methods,Silicon--Optical properties,Silicon--Nondestructive testing
رده :
TK7871
.
85
.
B654
2012
33. Principles of Semiconductor Network Testing
پدیدآورنده : Amir Afshar.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Integrated circuits -- Testing.,Semi-conducteurs -- Essais.,Semiconductors -- Testing.
رده :
TK7874
.
A457
1995
34. RF and microwave modeling and measurement techniques for field effect transistors
پدیدآورنده : Jianjun Gao.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Compound semiconductors-- Mathematical models.,Compound semiconductors-- Testing.,Field-effect transistors-- Mathematical models.,Field-effect transistors-- Testing.,Microwave measurements.,Radio measurements.
35. RF and microwave modeling and measurement techniques for field effect transistors /
پدیدآورنده : Jianjun Gao
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Compound semiconductors-- Mathematical models,Compound semiconductors-- Testing,Field-effect transistors-- Mathematical models,Field-effect transistors-- Testing,Microwave measurements,Radio measurements
رده :
TK7871
.
95
.
G36
2010
36. Reliability of gallium arsenide MMICs
پدیدآورنده :
موضوع : ، Microwave integrated circuits-- Reliability,، Microwave integrated circuits-- Testing,، Gallium arsenide semiconductors-- Reliability,، Gallium arsenide semiconductors-- Testing
۳ نسخه از این کتاب در ۳ کتابخانه موجود است.
37. Reliability of gallium arsenide MMICs
پدیدآورنده : edited by Aris Christou
کتابخانه: Central Library of Amirkabir University of Technology (Tehran)
موضوع : Microwave integrated circuits - Reliability , Microwave integrated circuits - Testing , Gallium arsenide semiconductors - Reliability , Gallium arsenide semiconductors - Testing
رده :
TK
7876
.
R445
38. Reliability of gallium arsenide mmics
پدیدآورنده : edited by: Aris christou
کتابخانه: (Semnan)
موضوع : ، Microwave integrated circuits- Reliability,، Microwave integrated circuits- Testing,، Gallium aresenide semiconductors- Reliability
رده :
TK
7876
.
R4
39. #Semiconductor device and failue analysis
پدیدآورنده : #Wai Kin Chim
کتابخانه: Central Library of Esfehan University of Technology (Esfahan)
موضوع : Semiconductors- Failures ،Semiconductors- Testing ،Semiconductors- Microscopy ،Photon emission
رده :
#
TK
،#.
C47
40. Semiconductor device and failure analysis using photon microscopy
پدیدآورنده : / by Wai Kin Chim
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Semiconductors- Failures,Semiconductors- Testing,Semiconductors- Microscopy,Photon emission
رده :
TK7871
.
85
.
C47
2000
